Improving the Practicality of Innovative DC Circuit Breakers Using Linear Motors Reon Sasaki; Wataru Ohnishi; Naoto Kodama; Yusuke Nakano; Shungo Zen; Yasushi Yamano; Yuki Inada
IEEJ Transactions on Industry Applications, Jul. 2025
Scientific journal
DOI：https://doi.org/10.1541/ieejias.145.506DOI ID：10.1541/ieejias.145.506,
ORCID：186985320 Global model for flashover phenomena in vacuum: A comprehensive perspectiveGuan-Jun Zhang; Guang-Yu Sun; Bai-Peng Song; Andreas Neuber; Yasushi Yamano
Journal of Applied Physics,
Volume：137,
Number：10, Mar. 2025,
[Reviewed]Flashover is an electrical breakdown along the dielectric-gas/vacuum/liquid interface under high electric field excitation. Surface flashover phenomena in vacuum greatly impede a variety of vacuum insulation devices and systems. Here, a comprehensive perspective of the vacuum flashover global model is provided to integrate existing understandings and highlight featured prospects of the flashover mechanisms, mitigation approaches, and applications. An overview of physical processes involved in the entire vacuum flashover process is first given. Recent advances and perspectives for the understanding of these processes are then discussed separately, including the surface discharge above dielectric, and the charge transport and breakdown within dielectric bulk and surface layer. Scaling laws and empirical formulas for flashover threshold prediction are assessed as well. The mechanisms of recent vacuum flashover mitigation approaches are analyzed, such as using physical structures and geometrical modifications, material-based approaches, and applying external electromagnetic field, and possible novel flashover mitigation methods are predicted. In addition, potential applications using vacuum flashover are discussed. Finally, promising research topics, imminent challenges, and open questions of the vacuum flashover studies are presented. It might be instructive for the fundamental and application research studies of surface flashover in vacuum in future.
AIP Publishing, English, Scientific journal
DOI：https://doi.org/10.1063/5.0255764DOI ID：10.1063/5.0255764,
ISSN：0021-8979,
eISSN：1089-7550 Relaxation of Electric Field by Covering Cathode Edge With Vanadate GlassSouichi Katagiri; Tatsuya Miyake; Takashi Naito; Hiroshi Morita; Yasushi Yamano
IEEE Transactions on Plasma Science,
Volume：52,
Number：9,
First page：4390,
Last page：4395, Sep. 2024,
[Reviewed]Institute of Electrical and Electronics Engineers (IEEE), English, Scientific journal
DOI：https://doi.org/10.1109/tps.2024.3396468DOI ID：10.1109/tps.2024.3396468,
ISSN：0093-3813,
eISSN：1939-9375 Triple Junction as a Weak Point of Electrical InsulationYasushi YAMANO
The Journal of The Institute of Electrical Engineers of Japan,
Volume：144,
Number：4,
First page：213,
Last page：216, Apr. 2024,
[Invited],
[Lead]Institute of Electrical Engineers of Japan (IEE Japan), Japanese, Scientific journal
DOI：https://doi.org/10.1541/ieejjournal.144.213DOI ID：10.1541/ieejjournal.144.213,
ISSN：1340-5551,
eISSN：1881-4190 Internal State of Fuse Arc Differentiating Interruption Success and Failure in Fuse‐SemiconductorDCCircuit BreakerYuta Miyaoka; Mitsuaki Maeyama; Yasushi Yamano; Yuki Inada
IEEJ Transactions on Electrical and Electronic Engineering,
Volume：19,
Number：1,
First page：41,
Last page：50, Oct. 2023,
[Reviewed]For the realization of sustainable society installing renewable energy sources, we have proposed a compact, low‐cost, versatile DC circuit breaker that combines a fuse and a power semiconductor. However, even under the same interruption conditions, there are cases where the interruption success and failure are observed probabilistically; the reason for this is still unknown. In the interruption failure, thermal reignition of an arc discharge occurs inside the fuse under transient recovery voltage. In this study, the spatiotemporal dynamics of the fuse arc was diagnosed for both interruption success and failure by a voltage–current waveform recording, high‐speed arc‐emission videography and borescope‐integrated optical emission spectroscopy, in order to identify the difference between the interruption success and failure. The waveform recording and videography demonstrated that at the arc initiation inside the fuse, the radial arc length for the interruption failure was longer than the interruption success. In the current interruption phase, the radial arc length was still longer, axial arc length was shorter, and arc column resistance was lower for the interruption failure. Further, the optical emission spectroscopy showed that localized regions with higher temperature and electrical conductivity existed for the failure in the current interruption phase. From these results, the dominant factors differentiating interruption success and failure were identified as the arc shape and electrical conductivity of the arc. To improve the interruption performance of the fuse and our DC circuit breaker, it is effective to increase the axial arc length, suppress the radial arc length, and reduce the electrical conductivity of the arc. © 2023 Institute of Electrical Engineer of Japan and Wiley Periodicals LLC.
Wiley, English, Scientific journal
DOI：https://doi.org/10.1002/tee.23928DOI ID：10.1002/tee.23928,
ISSN：1931-4973,
eISSN：1931-4981 Spatiotemporal evolution of electrical conductivity in current-limiting-fuse arcYuki Inada; Yusuke Fukai; Naoki Takayasu; Yusuke Nakano; Shungo Zen; Wataru Ohnishi; Yasushi Yamano; Mitsuaki Maeyama; Naoto Kodama
Journal of Physics D: Applied Physics,
Volume：56,
Number：50,
First page：505205,
Last page：505205, Oct. 2023,
[Reviewed]Abstract
To improve the interruption capacity of a current-limiting fuse, a detailed diagnosis of the spatial electrical conductivity distribution inside the fuse arc under the current limiting phase around current zero is required, because this distribution determines the distribution of transient recovery voltage inside the fuse. However, well-established methodologies applicable to fuse arcs are lacking, so the spatial distribution remains unknown. This study presents a borescope-integrated spectroscopic system that simultaneously obtains single-shot recordings of the axial distributions of the electron density and arc temperature in the fuse arc just before extinction. Combining the electron densities and arc temperatures, we can identify the fuse arc composition and hence calculate the axial electrical conductivity distribution under the first Chapman–Enskog approximation. The electrical conductivity provided by this systematic methodology includes no large uncertainties, thus demonstrating its superiority against previous estimation methods of the electrical conductivity.
IOP Publishing, English, Scientific journal
DOI：https://doi.org/10.1088/1361-6463/acf9b2DOI ID：10.1088/1361-6463/acf9b2,
ISSN：0022-3727,
eISSN：1361-6463 Conditioning Saturation Diagnosis With Breakdown Electric Field and Breakdown Time in VacuumShimin Li; Yasushi Yamano; Yingsan Geng; Chaohai Zhang
IEEE Transactions on Dielectrics and Electrical Insulation,
Volume：30,
Number：2,
First page：862,
Last page：868, Apr. 2023,
[Reviewed]Institute of Electrical and Electronics Engineers (IEEE), English, Scientific journal
DOI：https://doi.org/10.1109/tdei.2022.3228757DOI ID：10.1109/tdei.2022.3228757,
ISSN：1070-9878,
eISSN：1558-4135 Dependence of Vacuum Electrical Breakdown Field and Field Enhancement Factor on the Number of Apertures Drilled in Small Electrodes Ryo Ishida; Yasushi Yamano; Shinichi Kobayashi; Atsushi Kojima; Masaya Hanada; Yoshio Saito
ELECTRICAL ENGINEERING IN JAPAN,
Volume：196,
Number：3,
First page：3,
Last page：12, Aug. 2016,
[Reviewed]English, Scientific journal
DOI：https://doi.org/10.1002/eej.22842DOI ID：10.1002/eej.22842,
ISSN：0424-7760,
eISSN：1520-6416,
Web of Science ID：WOS:000374692400001 Analysis of Gases Desorbed from Oxygen-Free Copper by Irradiation with Single-Pulsed Electron Beam Hiroki Kaneko; Yasushi Yamano; Shinichi Kobayashi; Yoshio Saito
ELECTRONICS AND COMMUNICATIONS IN JAPAN,
Volume：97,
Number：10,
First page：30,
Last page：37, Oct. 2014,
[Reviewed]English, Scientific journal
DOI：https://doi.org/10.1002/ecj.11575DOI ID：10.1002/ecj.11575,
ISSN：1942-9533,
eISSN：1942-9541,
Web of Science ID：WOS:000341986800005 Dependence of vacuum electrical breakdown field and field enhancement factor on the number of apertures drilled in small electrodes
Ryo Ishida; Yasushi Yamano; Shinichi Kobayashi; Atsushi Kojima; Masaya Hanada; Yoshio Saito
PROCEEDINGS OF THE 2014 26TH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM (ISDEIV-2014), First page：45, Last page：48, 2014, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000369858100013
Voltage holding capability of large-size acceleration grid with multiple-apertures and multiple-stage for negative ion source Atsushi Kojima; Masaya Hanada; Takashi Inoue; Yasushi Yamano; Shinichi Kobayashi
Journal of the Vacuum Society of Japan,
Volume：56,
Number：12,
First page：502,
Last page：506, 2013,
[Reviewed]Japanese, Scientific journal
DOI：https://doi.org/10.3131/jvsj2.56.502DOI ID：10.3131/jvsj2.56.502,
ISSN：1882-2398,
SCOPUS ID：84891779702 Basic Research on the Fuse Element Pattern Changing a Current Pathway in the Process of Current Interruption
Masaki Tsuchiya; Yasushi Yamano; Shinichi Kobayashi; Kengo Hirose
2013 2ND INTERNATIONAL CONFERENCE ON ELECTRIC POWER EQUIPMENT - SWITCHING TECHNOLOGY (ICEPE-ST), 2013, [Reviewed]
English, International conference proceedings
Web of Science ID：WOS:000355108400092
Relationship between vacuum surface flashover and charging characteristics for alumina ceramics of lowered resistivity
H. Fukuda; Y. Yamano; S. Kobayashi; S. Michizono; Y. Saito; T. Maeda
2013 2ND INTERNATIONAL CONFERENCE ON ELECTRIC POWER EQUIPMENT - SWITCHING TECHNOLOGY (ICEPE-ST), 2013, [Reviewed]
English, International conference proceedings
Web of Science ID：WOS:000355108400075
Measurements of Field Electron Emission Sites Distribution for Oxygen Free Copper Electrodes and Microscopic Observations of Emission Sites KANAI Tomohiro; YAMANO Yasushi; KOBAYASHI Shinichi; SAITO Yoshio
IEEJ Transactions on Fundamentals and Materials,
Volume：132,
Number：11,
First page：958,
Last page：964, Nov. 2012
Electron emission is one of causes leading to electrical breakdown in vacuum. Distributions of field emission sites on a plane electrode before and after current conditioning procedure were investigated by using an Electron Emission Microscope. After the investigation of emission sites distribution, microscopic observation on some of the emission sites were carried out by using an Electron Emission Microscope. The observation revealed that field emission occurs at the foreign particles embedded on the electrode surface. To characterize the emission sites, we observed the absorption current image and analyzed the chemical composition of the emission sites by using an auger electron spectrometer. Observation and analysis suggest that the foreign particle was a semiconducting or insulating material composed of carbon.
The Institute of Electrical Engineers of Japan, Japanese
DOI：https://doi.org/10.1541/ieejfms.132.958DOI ID：10.1541/ieejfms.132.958,
ISSN：0385-4205,
CiNii Articles ID：10031120059,
CiNii Books ID：AN10136312 Analysis of Desorbed Gases from Oxygen-free Copper Stimulated by Irradiation with Single Pulsed Electron Beam KANEKO Hiroki; YAMANO Yasushi; KOBAYASHI Shinichi; SAITO Yoshio
IEEJ Transactions on Fundamentals and Materials,
Volume：132,
Number：11,
First page：951,
Last page：957, Nov. 2012
Desorbed gases from anode stimulated by electron irradiation are regarded as one of causes leading to vacuum breakdown. To understand the vacuum breakdown phenomena, it is important to analyze composition and quantity of electron stimulated desorption gases. Single pulsed electron beam irradiation method was developed for the detailed analysis of the desorbed gas characteristics. It is possible for this method to reduce the modification of surface condition due to electron beam irradiation and enables to measure the transition of gas desorption rate from the virgin surface state to a certain period. Using this method, we investigated the desorbed gases from oxygen-free copper electrode. It was found that electron irradiation caused H
2 gas desorption from copper electrode and the conditioning of the gas desorption. Moreover, a large amount of H
2 gas was desorbed when the first electron beam was irradiated. By using desorbed gases analysis method stimulated by irradiation with single pulsed electron beam, it is possible to observe change of gas desorption rate from virgin surface to a certain number of electron irradiated surface state. Analyzing desorbed gas from the sample in detail can evaluate the electrode material in vacuum.
The Institute of Electrical Engineers of Japan, Japanese
DOI：https://doi.org/10.1541/ieejfms.132.951DOI ID：10.1541/ieejfms.132.951,
ISSN：0385-4205,
CiNii Articles ID：10031120058,
CiNii Books ID：AN10136312 Relationship between Vacuum Surface Flashover and Charging Characteristics for Various kinds of Alumina Ceramics
H. Fukuda; Y. Yamano; S. Kobayashi; S. Michizono; Y. Saito; T. Maeda
25TH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM (ISDEIV 2012), First page：133, Last page：136, 2012, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000315985400036
Vacuum surface flashover characteristics and secondary electron emission characteristics of epoxy resin and FRP insulator Yasushi Yamano; Masahiro Takahashi; Shinichi Kobayashi; Masaya Hanada; Yoshitaka Ikeda
IEEJ Transactions on Fundamentals and Materials,
Volume：130,
Number：12,
First page：3,
Last page：1072, 2010,
[Reviewed]Japanese, Scientific journal
DOI：https://doi.org/10.1541/ieejfms.130.1067DOI ID：10.1541/ieejfms.130.1067,
ISSN：0385-4205,
SCOPUS ID：78951483241 Measurement of charged particle current diffused from vacuum arc Masamichi Furesawa; Yasushi Yamano; Shinichi Kobayashi
IEEJ Transactions on Fundamentals and Materials,
Volume：130,
Number：9,
First page：5,
Last page：810, 2010,
[Reviewed]Japanese, Scientific journal
DOI：https://doi.org/10.1541/ieejfms.130.805DOI ID：10.1541/ieejfms.130.805,
ISSN：0385-4205,
SCOPUS ID：78049444015 Effect of Surface Ion Exchange of Machinable Ceramic on Its Flashover Characteristics in Vacuum
Xue-Zeng Huang; Kai-Kun Yu; Guan-Jun Zhang; Nan Zheng; Jie Tian; Guang-Xin Li; Xin-Pei Ma; Yasushi Yamano; Shinichi Kobayashi
ISDEIV 2010: XXIVTH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, First page：83, Last page：86, 2010, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000287378600021
Comparison of Surface Charge Distributions under Vacuum and Atmospheric Condition Due to Surface Discharge Events
Yasushi Yamano; Haruki Yamazaki; Shinichi Kobayashi; Yoshio Saito; Guan-jun Zhang
ISDEIV 2010: XXIVTH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, First page：95, Last page：98, 2010, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000287378600024
Surface Conditions and Vacuum Breakdown Characteristics of Titanium Electrodes Lathed by Different Cutting Tool Bits and Treated by Chemical Polishing Method
Y. Yamano; T. Yoshida; S. Kobayashi; S. Michizono; Y. Saito
ISDEIV 2010: XXIVTH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, First page：47, Last page：50, 2010, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000287378600012
Estimation of surface charges on dielectric materials for high power rf windows Shinichiro Michizono; Yoshio Saito; Suharyanto; Yasushi Yamano; Shinichi Kobayashi
APPLIED SURFACE SCIENCE,
Volume：256,
Number：4,
First page：950,
Last page：953, Nov. 2009,
[Reviewed]English, Scientific journal
DOI：https://doi.org/10.1016/j.apsusc.2009.07.026DOI ID：10.1016/j.apsusc.2009.07.026,
ISSN：0169-4332,
Web of Science ID：WOS:000272342300007 Energy Spectra of Bremsstrahlung X-Rays Emitted From an FRP Insulator Yutaka Tanaka; Yoshitaka Ikeda; Masaya Hanada; Kaoru Kobayashi; Masaki Kamada; Masashi Kisaki; Noboru Akino; Yasushi Yamano; Shinichi Kobayashi; Larry R. Grisham
IEEE TRANSACTIONS ON PLASMA SCIENCE,
Volume：37,
Number：8,
First page：1495,
Last page：1498, Aug. 2009,
[Reviewed]English, Scientific journal
DOI：https://doi.org/10.1109/TPS.2009.2020402DOI ID：10.1109/TPS.2009.2020402,
ISSN：0093-3813,
Web of Science ID：WOS:000268822500024 Characteristics of Voltage Holding Capability in Multi-stage Large Electrostatic Accelerator for Fusion Application
Kaoru Kobayashi; Masaya Hanada; Noboru Akino; Shunichi Sasaki; Yoshitaka Ikeda; Masahiro Takahashi; Yasushi Yamano; Shinichi Kobayashi; Larry R. Grisham
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, Volume：16, Number：3, First page：871, Last page：875, Jun. 2009, [Reviewed]
English, Scientific journal
ISSN：1070-9878, Web of Science ID：WOS:000267035200038
Measurement of surface and volume resistivity of UV‐irradiated or EB‐irradiated insulator materials for satellites
小宮山丈行; 山納康; 小林信一; 馬場勧; 宮崎英治; 仁田工美
宇宙航空研究開発機構特別資料 JAXA-SP-, Number：08-018, First page：98, Last page：101, Mar. 2009
Japanese
ISSN：1349-113X, J-Global ID：201002277792507136
Observation of Pulse Current Occurring during Spark Conditioning Process of Ultra High Vacuum Gap KAWADA Masashi; YAMANO Yasushi; SAITO Yoshio; KOBAYASHI Shinichi
IEEJ Transactions on Fundamentals and Materials,
Volume：128,
Number：10,
First page：629,
Last page：634, Oct. 2008
It is known that the hold-off voltages of vacuum gaps can be improved by the spark conditioning with repetitive electrical breakdowns. At the early stage of spark conditioning process, small pulse currents (not breakdowns) were observed, and in turn hold-off voltages were improved. To investigate the characteristics of the pulse current occurrences and the reason of the improvement in hold-off voltages, experiments on pulse current observations for a vacuum gap were carried out, and chemical compositions on the electrode surfaces were analyzed before and after the experiments by an X-ray photoelectron spectroscopy (XPS). Pulse current observations confirmed that the currernt peak value decreases with repetitive voltage applications and then the phenomena occurring during the conditioning process change over from pulse current event to breakdowns. The XPS analysis revealed that the electrode surface was cleaned by repetitive pulse current occurrences. This result suggests that cleaning the electrode surface by repetitive pulse current occurrences would be one of causes of the improvement in hold-off voltages of a vacuum gap at the early stage of conditioning process.
The Institute of Electrical Engineers of Japan, English
DOI：https://doi.org/10.1541/ieejfms.128.629DOI ID：10.1541/ieejfms.128.629,
ISSN：0385-4205,
CiNii Articles ID：10024470272,
CiNii Books ID：AN10136312 Recent R&D activities of negative-ion-based ion source for JT-60SA Yoshitaka Ikeda; Masaya Hanada; Masaki Kamada; Kaoru Kobayashi; Naotaka Umeda; Noboru Akino; Noboru Ebisawa; Takashi Inoue; Atsushi Honda; Mikito Kawai; Minoru Kazawa; Katsumi Kikuchi; Masao Komata; Kazuhiko Mogaki; Katsuya Noto; Kuzumi Oasa; Katsumi Oshima; Shunichi Sasaki; Tatsuya Simizu; Tadashi Takenouchi; Yutaka Tanai; Katsutomi Usui; Kazuhiro Watanabe; Larry R. Grisham; Shinichi Kobayashi; Yasushi Yamano; Masahiro Takahashi
IEEE TRANSACTIONS ON PLASMA SCIENCE,
Volume：36,
Number：4,
First page：1519,
Last page：1529, Aug. 2008,
[Reviewed]English, Scientific journal
DOI：https://doi.org/10.1109/TPS.2008.927382DOI ID：10.1109/TPS.2008.927382,
ISSN：0093-3813,
Web of Science ID：WOS:000258618300011 Surface discharge related properties of fiberglass reinforced plastic insulator for use in neutral beam injector of JT-60U Y. Yamano; M. Takahashi; S. Kobayashi; M. Hanada; Y. Ikeda
REVIEW OF SCIENTIFIC INSTRUMENTS,
Volume：79,
Number：2,
First page：02A524-1-02A524-4, Feb. 2008
English, Scientific journal
DOI：https://doi.org/10.1063/1.2828069DOI ID：10.1063/1.2828069,
ISSN：0034-6748,
Web of Science ID：WOS:000254194800056 Investigation of Pulse Current Occurrence Observed for Spark Conditioning Process of Ultra High Vacuum gap
S. Kobayashi; M. Kawada; Y. Yamano; Y. Saito
ISDEIV 2008: PROCEEDINGS OF THE XXIIIRD INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, VOLS 1 AND 2, First page：39, Last page：+, 2008, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000261588200010
Measurement of Surface and Volume Resistivity for Alumina Ceramics under Vacuum Condition
Yasushi Yamano; Takeyuki Komiyama; Masahiro Takahashi; Shinichi Kobayashi; Kumi Nitta; Yoshio Saito
ISDEIV 2008: PROCEEDINGS OF THE XXIIIRD INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, VOLS 1 AND 2, First page：35, Last page：+, 2008, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000261588200009
Real-Time Measurement of Surface Charge Distributions on Insulator before and after Vacuum Surface Discharge Events
Takeshi Ochiai; Yasushi Yamano; Shinichi Kobayashi; Yoshio Saito
ISDEIV 2008: PROCEEDINGS OF THE XXIIIRD INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, VOLS 1 AND 2, First page：43, Last page：+, 2008, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000261588200011
Vacuum Breakdown Characteristics of Oxygen-Free Copper Electrodes with Different Keeping Methods and Terms
Kota Minaminosono; Yasushi Yamano; Shinichi Kobayashi; Yoshio Saito
ISDEIV 2008: PROCEEDINGS OF THE XXIIIRD INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, VOLS 1 AND 2, First page：227, Last page：+, 2008, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000261588200057
Effect of mechanical finishes on secondary electron emission of alumina ceramics
Suharyanto; Yasushi Yamano; Shinichi Kobayashi
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, Volume：14, Number：3, First page：620, Last page：626, Jun. 2007, [Reviewed]
English, Scientific journal
ISSN：1070-9878, Web of Science ID：WOS:000246982000015
Secondary electron emission of TiN-coated alumina ceramics Suharyanto; Shinichiro Michizono; Yoshio Saito; Yasushi Yamano; Shinichi Kobayashi
VACUUM,
Volume：81,
Number：6,
First page：799,
Last page：802, Feb. 2007,
[Reviewed]English, Scientific journal
DOI：https://doi.org/10.1016/j.vacuum.2005.11.062DOI ID：10.1016/j.vacuum.2005.11.062,
ISSN：0042-207X,
Web of Science ID：WOS:000244816800017 Surface characteristics and electrical breakdown of alumina materials Shinichiro Michizono; Yoshio Saito; Suharyanto; Yasushi Yamano; Shinichi Kobayashi
VACUUM,
Volume：81,
Number：6,
First page：762,
Last page：765, Feb. 2007,
[Reviewed]English, Scientific journal
DOI：https://doi.org/10.1016/j.vacuum.2005.11.058DOI ID：10.1016/j.vacuum.2005.11.058,
ISSN：0042-207X,
Web of Science ID：WOS:000244816800008 Dependence of current interruption performance on the element patterns of etched fuses
Yuzo Ishikawa; Kengo Hirose; Mitsuo Asayama; Yasushi Yamano; Shinichi Kobayashi
ICEFA 2007: EIGHTH INTERNATIONAL CONFERENCE ON ELECTRIC FUSES AND THEIR APPLICATIONS, PROCEEDINGS, First page：51, Last page：56, 2007, [Reviewed]
English, International conference proceedings
Web of Science ID：WOS:000253703300008
Vacuum electrical breakdown characteristics and surface condition of Ti electrodes with oxidation conditions Y Ito; Y Yamano; S Kobayashi; Y Saito
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,
Volume：13,
Number：1,
First page：98,
Last page：104, Feb. 2006
English, Scientific journal
DOI：https://doi.org/10.1109/TDEI.2006.1593407DOI ID：10.1109/TDEI.2006.1593407,
ISSN：1070-9878,
CiNii Articles ID：120001371240,
Web of Science ID：WOS:000235419200014 Secondary electron emission and surface charging evaluation of alumina ceramics and sapphire Suharyanto; Y Yamano; S Kobayashi; S Michizono; Y Saito
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,
Volume：13,
Number：1,
First page：72,
Last page：78, Feb. 2006
English, Scientific journal
DOI：https://doi.org/10.1109/TDEI.2006.1593403DOI ID：10.1109/TDEI.2006.1593403,
ISSN：1070-9878,
CiNii Articles ID：120001371239,
Web of Science ID：WOS:000235419200010 Measurement of 2-dimensional surface charge distributions under vacuum flashover events on insulators with sub-milli-second temporal resolution Yasushi Yamano; M. Miyazaki; Shinichi Kobayashi; Yoshio Saito
Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV,
Volume：1,
First page：152,
Last page：155, 2006,
[Reviewed]English, International conference proceedings
DOI：https://doi.org/10.1109/DEIV.2006.357254DOI ID：10.1109/DEIV.2006.357254,
ISSN：1093-2941,
SCOPUS ID：46649094414 Vacuum breakdown characteristics for electrodes paired with cathodes and with anodes processed by spark conditioning Yasushi Yamano; Takahiro Otsuka; Shinichi Kobayashi; Yoshio Saito
IEEJ Transactions on Fundamentals and Materials,
Volume：126,
Number：8,
First page：775,
Last page：781, 2006
Japanese
DOI：https://doi.org/10.1541/ieejfms.126.775DOI ID：10.1541/ieejfms.126.775,
ISSN：0385-4205,
SCOPUS ID：33746921909 Secondary electron emission from alumina materials used for high-power RF windows Shinichiro Michizono; Yoshio Saito; Suharyanto; Yasushi Yamano; Shinichi Kobayashi
IEEJ Transactions on Fundamentals and Materials,
Volume：126,
Number：8,
First page：751,
Last page：756, 2006
Japanese
DOI：https://doi.org/10.1541/ieejfms.126.751DOI ID：10.1541/ieejfms.126.751,
ISSN：0385-4205,
SCOPUS ID：33746869953 Secondary electron emission from alumina with a multi-pulse irradiation method Shinichiro Michizono; Yoshio Saito; Suharyanto; Yasushi Yamano; Shinichi Kobayashi
Shinku/Journal of the Vacuum Society of Japan,
Volume：48,
Number：3,
First page：145,
Last page：147, 2005,
[Reviewed]Vacuum Society of Japan, Japanese, Scientific journal
DOI：https://doi.org/10.3131/jvsj.48.145DOI ID：10.3131/jvsj.48.145,
ISSN：0559-8516,
SCOPUS ID：20444497411 Secondary electron emission of sapphire and anti-multipactor coatings at high temperature Shinichiro Michizono; Yoshio Saito; Suharyanto; Yasushi Yamano; Shinichi Kobayashi
Applied Surface Science,
Volume：235,
Number：1-2,
First page：227,
Last page：230, Jul. 2004,
[Reviewed]English, International conference proceedings
DOI：https://doi.org/10.1016/j.apsusc.2004.05.131DOI ID：10.1016/j.apsusc.2004.05.131,
ISSN：0169-4332,
SCOPUS ID：4344564634 Temperature dependence of secondary electron emission on alumina and anti-multipactor coatings Shinichiro Michizono; Yoshio Saito; Suharyanto; Yasushi Yamano; Shinichi Kobayashi
Shinku/Journal of the Vacuum Society of Japan,
Volume：47,
Number：3,
First page：120,
Last page：123, 2004,
[Reviewed]Vacuum Society of Japan, Japanese, Scientific journal
DOI：https://doi.org/10.3131/jvsj.47.120DOI ID：10.3131/jvsj.47.120,
ISSN：0559-8516,
SCOPUS ID：33750808900 Secondary electron emission and surface charging from alumina at high temperature S. Michizono; Y. Saito; Suharyanto; Y. Yamano; S. Kobayashi
Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV,
Volume：1,
First page：51,
Last page：54, 2004,
[Reviewed]English, International conference proceedings
DOI：https://doi.org/10.1109/DEIV.2004.1418598DOI ID：10.1109/DEIV.2004.1418598,
ISSN：1093-2941,
SCOPUS ID：16244364350 Effect of in situ heat treatment on surface flashover characteristic and surface condition of alumina in vacuum
Y Tsukamoto; Y Yamano; S Kobayashi; Y Saito
ISDEIV: XXITH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, VOLS 1 AND 2, PROCEEDINGS, Volume：21, First page：118, Last page：121, 2004, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000226098000029
Secondary electron emission of dielectric materials under high temperature condition
Suharyanto; S Michizono; Y Yamano; Y Saito; S Kobayashi
ISDEIV: XXITH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, VOLS 1 AND 2, PROCEEDINGS, Volume：21, First page：21, Last page：24, 2004, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000226098000006
Vacuum electrical breakdown characteristics and surface chemical compositions of titanium electrodes with oxidation conditions
Y Ito; Y Yamano; S Kobayashi; Y Saito
ISDEIV: XXITH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, VOLS 1 AND 2, PROCEEDINGS, Volume：21, First page：80, Last page：83, 2004, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000226098000020
Effect of sputtering in vacuum and repetitive breakdowns on field emission characteristic
K Terui; Y Yamano; S Kobayashi; Y Saito
ISDEIV: XXTH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, PROCEEDINGS, Volume：20, First page：503, Last page：506, 2002, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000178625000119
Luminescence spectra emitted at surface flashovers on aluminas in vacuum
S Aoki; Y Yamano; S Kobayashi; Y Saito
ISDEIV: XXTH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, PROCEEDINGS, Volume：20, First page：431, Last page：434, 2002, [Reviewed]
English, International conference proceedings
ISSN：1093-2941, Web of Science ID：WOS:000178625000101
Charging characteristics on dielectric surface by different charging processes in vacuum Y Yamano; A Ohashi; K Kato; H Okubo; Y Hakamata
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,
Volume：6,
Number：4,
First page：464,
Last page：468, Aug. 1999
English, Scientific journal
DOI：https://doi.org/10.1109/94.788746DOI ID：10.1109/94.788746,
ISSN：1070-9878,
eISSN：1558-4135,
CiNii Articles ID：30020038289,
Web of Science ID：WOS:000082543000016
Microplasma discharge in ethanol solution: Characterization and its application to the synthesis of carbon microstructures Qiang Chen; Takaya Kitamura; Kenji Saito; Koji Haruta; Yasushi Yamano; Tatsuo Ishikawa; Hajime Shirai
THIN SOLID FILMS,
Volume：516,
Number：13,
First page：4435,
Last page：4440, May 2008
English
DOI：https://doi.org/10.1016/j.tsf.2007.10.052DOI ID：10.1016/j.tsf.2007.10.052,
ISSN：0040-6090,
Web of Science ID：WOS:000255584800013 Influence of mechanical finishing on secondary electron emission of alumina ceramics Suharyanto; S. Michizono; Y. Saito; Tumiran; Y. Yamano; S. Kobayashi
Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV,
Volume：1,
First page：97,
Last page：100, 2006
English
DOI：https://doi.org/10.1109/DEIV.2006.357240DOI ID：10.1109/DEIV.2006.357240,
ISSN：1093-2941,
SCOPUS ID：46649099104 Development of the high votage etching fuse for protecting semiconductors
浅山三夫; 石川雄三; 広瀬健吾; 小林信一; 山納康
Number：6, First page：67, Last page：70, 2005
We are continuing to develop high voltage etching fuse for protecting semiconductors. Last year fundamental researches to find etching patterns bringing better current breaking capability were conducted, and successfully completed. This year 7.2kV rating etching fuse was developed based on the results of fundamental researches of last year. It was confirmed that this type of etching fuse has good breaking performance and smaller I2t value compared with target value were obtained.Therefore it will be possible to produce a high voltage etching fuse for protecting semiconductors having lower I2t than those of current products.
Japanese
ISSN：1347-4758, CiNii Articles ID：120001371340, CiNii Books ID：AA11808968
高圧半導体保護用エッチングヒューズの開発 (続）
浅山三夫; 石川雄三; 広瀬健吾; 小林信一; 山納康
埼玉大学地域共同研究センター紀要, Number：6, First page：67, Last page：70, 2005
We are continuing to develop high voltage etching fuse for protecting semiconductors. Last year fundamental researches to find etching patterns bringing better current breaking capability were conducted, and successfully completed. This year 7.2kV rating etching fuse was developed based on the results of fundamental researches of last year. It was confirmed that this type of etching fuse has good breaking performance and smaller I2t value compared with target value were obtained.Therefore it will be possible to produce a high voltage etching fuse for protecting semiconductors having lower I2t than those of current products.
Japanese
ISSN：1347-4758, CiNii Articles ID：120001371340, CiNii Books ID：AA11808968
真空沿面放電時のトリプルジャンクションにおける電子放出箇所の微視的観測
山納康
総合研究機構研究プロジェクト研究成果報告書, Volume：16年度, 2005
Erratum to "Secondary electron emission of sapphire and anti-multipactor coatings at high temperature" (vol 235, pg 227, 2004) S Michizono; Y Saito; Suharyanto; Y Yamano; S Kobayashi
APPLIED SURFACE SCIENCE,
Volume：239,
Number：1,
First page：125,
Last page：125, Dec. 2004
English, Others
DOI：https://doi.org/10.1016/j.apsusc.2004.10.016DOI ID：10.1016/j.apsusc.2004.10.016,
ISSN：0169-4332,
Web of Science ID：WOS:000225140900016 Charging characteristics and electric field distribution on alumina as affected by triple junctions in vacuum Y Yamano; S Ito; K Kato; H Okubo; Y Hakamata
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,
Volume：9,
Number：2,
First page：173,
Last page：177, Apr. 2002
English
DOI：https://doi.org/10.1109/94.993731DOI ID：10.1109/94.993731,
ISSN：1070-9878,
eISSN：1558-4135,
CiNii Articles ID：80015188876,
Web of Science ID：WOS:000175044500004 真空中の2次電子なだれによる固体絶縁物上の正極性帯電形成条件
山納康; 伊藤慎悟; 加藤克巳; 早川直樹; 袴田好美; 大久保仁
Volume：2000, Number：1, 2000
J-Global ID：201302152014349862
Influence of electric field distribution on charging mechanism on alumina dielectrics by triple junction in vacuum
Y Yamano; S Ito; K Kato; Y Hakamata; H Okubo
ISDEIV: XIXTH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, VOLS 1 AND 2, PROCEEDINGS, Volume：19, First page：135, Last page：138, 2000
English
ISSN：1093-2941, Web of Science ID：WOS:000166521200036
Investigation of 2-dimensional charge distribution on dielectric surface in vacuum by real-time measurement technique
K Kato; S Ito; Y Yamano; Y Hakamata; H Okubo
ISDEIV: XIXTH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, VOLS 1 AND 2, PROCEEDINGS, Volume：19, First page：94, Last page：97, 2000
English
ISSN：1093-2941, Web of Science ID：WOS:000166521200026
Influence of Electric Field Distribution on Charging Mechanism on Alumina Dielectrics in Vacuum
YAMANO Yasushi; ITO Shingo; KATO Katsumi; HAKAMATA Yoshimi; OKUBO Hitoshi
Volume：1999, Number：183, First page：19, Last page：24, 19 Nov. 1999
Japanese
CiNii Articles ID：10016803461, CiNii Books ID：AN10320559
Illumination Image Characteristics of Laser-Induced Plasma on Solid Target in Vacuum
YAMANO Yasushi; OHASHI Atsushi; KATO Katsumi; OKUBO Hitoshi
The Transactions of the Institute of Electrical Engineers of Japan. A, Volume：119, Number：6, First page：878, Last page：883, 01 Jun. 1999
Japanese
ISSN：0385-4205, CiNii Articles ID：10004540328, CiNii Books ID：AN10136312
Characteristics of Laser-induced Plasma and Laser-triggered Discharge in Low Vacuum
OHASHI Atsushi; YAMANO Yasushi; KATO Katsumi; OKUBO Hitoshi
The Transactions of the Institute of Electrical Engineers of Japan. A, Volume：119, Number：4, First page：469, Last page：474, Apr. 1999
Japanese
ISSN：0385-4205, CiNii Articles ID：10004442458, CiNii Books ID：AN10136312
真空中におけるトリプルジャンクション近傍の電界分布と絶縁物上帯電特性
山納康; 伊藤慎悟; 加藤克巳; 早川直樹; 袴田好美; 大久保仁
Volume：1999, 1999
J-Global ID：200902124211623562
Electric Field Distribution and Charging Characteristics on Solid Dielectric Surface in Vacuum.
山納康; 伊藤慎悟; 加藤克巳; 早川直樹; 袴田好美; 大久保仁
電気学会基礎・材料・共通部門大会講演論文集, Volume：1999, 1999
J-Global ID：200902155187738402
真空中の電子照射による絶縁物上帯電分布の形成機構
山納康; 大橋敦; 加藤克巳; 袴田好美; 大久保仁
電気学会 論文誌A, Volume：119-A, Number：6, First page：841, Last page：847, 1999
ISSN：0385-4205, J-Global ID：200902104443397185
真空中における電子ビームによるアルミナ上帯電分布のビーム照射時間依存性
山納康; 林裕昭; 大橋敦; 加藤克巳; 袴田好美; 大久保仁
Volume：1998, Number：1, 1998
J-Global ID：200902137035121347
Charging characteristics on various insulators by electron beam irradiation in vacuum.
山納康; 大橋敦; 加藤克巳; 早川直樹; 袴田好美; 大久保仁
電気関係学会東海支部連合大会講演論文集, Volume：1998, 1998
J-Global ID：200902169207147369
低真空中における不平等電界下の放電現象
大久保仁; 山納康; 大橋敦; 加藤克巳
Volume：1998, Number：1, 1998
J-Global ID：200902182880661127
Vacuum discharge phenomena under non-uniform field conditions
H Okubo; Y Yamano; A Ohashi; K Kato
ISDEIV: XVIIITH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM - PROCEEDINGS, VOLS 1 AND 2, Volume：18, First page：93, Last page：100, 1998
English
ISSN：1093-2941, Web of Science ID：WOS:000077494100022
Charging characteristics on dielectric surface by different charging process in vacuum
Y Yamano; A Ohashi; K Kato; Y Hakamata; H Okubo
ISDEIV: XVIIITH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM - PROCEEDINGS, VOLS 1 AND 2, Volume：18, First page：174, Last page：178, 1998
English
ISSN：1093-2941, Web of Science ID：WOS:000077494100041
Charging Characteristics on Dielectric Surface by Different Charging Process in Vacuum
OHASHI Atsushi; YAMANO Yasushi; KATO Katsumi; HAKAMATA Yoshimi; OKUBO Hitoshi
Volume：1997, Number：100, First page：31, Last page：36, 30 Sep. 1997
Japanese
CiNii Articles ID：10016817467, CiNii Books ID：AN10320559
Charge generation on alumina sample in vacuum by triple junction.
大橋敦; 山納康; 加藤克巳; 袴田好美; 大久保仁
電気関係学会東海支部連合大会講演論文集, Volume：1997, 1997
J-Global ID：200902131333590394
